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400-0305-668
库存状态:现货
DAGE X 射线检测系统 XD7500 - 1 可产生高分辨率、高放大倍数的 X 射线图像,能检测物体内部缺陷。主要应用于 PCB 和半导体工业,如芯片内部焊接检测、PCB 板缺陷检查等135。
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