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库存状态:现货
Applied Materials 的 UVision 4 MAIN 是先进的晶圆检测设备,能利用深紫外激光扫描,通过多频道探测器收集信号检测晶圆缺陷,应用于半导体和化合物半导体行业,可检测多种缺陷并提供分析报告。
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