RUDOLPH TECHNOLOGY 薄膜测量 UlteaPort5 - Haixiang Technology Co., Ltd

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RUDOLPH TECHNOLOGY 薄膜测量 UlteaPort5

库存状态：现货

RUDOLPH TECHNOLOGY 的 UlteaPort5 是一款高精度薄膜测量设备，基于光谱椭偏或光学反射技术，可非接触式测量薄膜厚度、折射率及光学特性，支持多层膜分析和复杂结构表征。其模块化设计适用于半导体制造、显示面板、光学涂层等领域，可实现工艺监控、质量控制及研发阶段的材料分析，尤其在透明 / 不透明薄膜、纳米级涂层检测中表现优异。

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