NOVA 晶圆检测 NOVASCAN3090-300 - Haixiang Technology Co., Ltd

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NOVA 晶圆检测 NOVASCAN3090-300

库存状态：现货

NOVA 晶圆检测设备 NOVASCAN3090-300 专为半导体制造设计，具备高精度缺陷检测与关键尺寸量测能力。其采用先进光学或电子束技术，可识别晶圆表面纳米级缺陷，支持 300mm 晶圆的全片扫描，适用于逻辑芯片、存储芯片等制程的在线检测与工艺监控，帮助提升良率并优化生产流程。

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