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库存状态:现货
X-TEK SYSTEMS LTD X 射线检测系统 XTV160 可对物体进行非接触式内部成像检测。它能穿透物体,根据射线衰减程度生成内部结构图像,用于检测工业产品的内部缺陷,如电子元件焊接问题、材料裂缝等,也可用于科研领域的材料分析。
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