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TOKYO ELECTRON 探针台 P-12XLn

库存状态:现货

TOKYO ELECTRON 探针台 P-12XLn 专为先进半导体晶圆测试设计,支持 300mm 晶圆,具备高精度定位系统与自动化晶圆处理能力。其集成射频测试模块,可实现高频信号传输与低损耗测试,适用于 5G 芯片、AI 处理器等复杂电路的电性能验证。设备兼容多探针卡配置,支持纳米级线宽测试,广泛应用于逻辑芯片、存储芯片及功率器件的研发与量产测试,尤其在 7nm 以下制程的可靠性评估中表现优异。

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Product Name

Product Name

Product Model

Product Model

list

list

Current boot status

Current boot status

Date of Production

Date of Production

Current situation confirmation
Current situation confirmation
Online images

Online images

Remote Video

Remote Video

On site inspection of goods

On site inspection of goods

Sending samples for testing

Sending samples for testing

Equipment Acceptance
Equipment Acceptance
Contract Signing

Contract Signing

Express delivery acceptance

Express delivery acceptance

On site acceptance and shipment

On site acceptance and shipment

After sales guarantee
After sales guarantee
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