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库存状态:现货
TOKYO ELECTRON 探针台 P-12XLn 专为先进半导体晶圆测试设计,支持 300mm 晶圆,具备高精度定位系统与自动化晶圆处理能力。其集成射频测试模块,可实现高频信号传输与低损耗测试,适用于 5G 芯片、AI 处理器等复杂电路的电性能验证。设备兼容多探针卡配置,支持纳米级线宽测试,广泛应用于逻辑芯片、存储芯片及功率器件的研发与量产测试,尤其在 7nm 以下制程的可靠性评估中表现优异。
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