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400-0305-668
库存状态:现货
SEMICS 探针台 OPUS - II 具有高精度定位、缺陷分析等功能,配备多种传感器和相机,可准确检测晶圆缺陷。适用于 SOC、Memory 等多种类型产品测试,涵盖半导体晶圆检测、芯片研发及失效分析等领域。
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list
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On site inspection of goods
Sending samples for testing
Contract Signing
Express delivery acceptance
On site acceptance and shipment
Provide services based on the actual situation of the machine