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库存状态：现货
MITUTOYO QVE250 - PRO EL1S 光学测量仪，具高精度光学成像等功能，可非接触测量物体尺寸、形状等，用于精密机械、电子等领域的质量检测。
TENCOR 10 - 02000 台阶轮廓仪，能测样品微米到纳米尺度轮廓，通过触针滑动记录轨迹，用于半导体、LED 等领域的薄膜厚度测量及表面轮廓分析。
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